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Overview

Optical simulator SunShine is based on a semi-coherent model describing light propagation in a multilayer structures with flat and nano-textured interfaces. Primarily it has been developed for optimisation of thin-film silicon solar cells.  

 

 

 

Key features

• combined models for coherent specular and incoherent diffused light
• scalar scattering theory used for calculation of haze parameter - calibration possible 
• different internal angular distribution functions of scattered light available - possibility to import external values
• up to three incoherent layers
• user friendly graphical interface, simple presentation of the results
• optimisation tool

 

Demo version

SunShine Demo (ZIP archive)

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Description

Applicability

Primarily SunShine simulator was developed to analyze and improve thin-film silicon solar cells (amorphous, microcrystalline, micromorph, multi-junction) [1], [2], [4]. Besides, the simulator was successfully applied also to other thin-film PV technlologies, among them CdTe and CIGS [5]. It was developed an approach to simulate dye-sensitized solar cells as well [6]. Furthermore, we included a model for simulation of plasmonic effects of metal nano-particles [3].

 

Model

The developed 1D semi-coherent model combines coherent propagation of speculer light (in terms of electromagnetic waves) all over the structure and incoherent propagation of diffused light, which was scattered at textured interfaces. Scalar scattering theory is used to determine haze parameters for reflected and transmitted light at each textured interface. Calibrations of the calculated haze parameters are possible. Angular distribution functions of diffused light are selected by the user either as one of the internally defined function or imported from the measurements or calculations. The functions can be dependent on incident angle of incoming light or rms roughness of the interface. The model enables also correction of total reflectances at (textured) interfaces.

Main input data: structure with defined layers (complex refractive indexes as a function of wavelength), rms roughnesses of interfaces, correction functions for haze and total reflection, angular distribution functions

Main output parameters: individual layer absorptances, total, diffused and specular reflectances and transmittances, charge carrier generation rate profile, short-circuit currents

More about the model you can find in the book [1].

 

User Manual

SunShine User Manual v1.2.8

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References

Publications

1. KRČ, Janez, TOPIČ, Marko. Optical modeling and simulation of thin-film photovoltaic devices. New York: CRC Press, 2013. XIII, 258 pages,  ISBN 978-1-4398-1849-7. ISBN 1-4398-1849-5.
2. KRČ, Janez, LIPOVŠEK, Benjamin, TOPIČ, Marko. Light management in thin-film solar cell. V: LÓPEZ, Ana Belén Cristóbal (ur.), VEGA, Antonio Martí (ur.), LÓPEZ, Antonio Luque (ur.). Next generation of photovoltaics : new concepts, (Springer series in optical sciences, ISSN 0342-4111, 165). Berlin; Heidelberg: Springer, cop. 2012, pp. 95-129.
3. SCHMID, Martina, KLENK, R., LUX-STEINER, M. Ch., TOPIČ, Marko, KRČ, Janez. Modeling plasmonic scattering combined with thin-film optics.Nanotechnology, ISSN 0957-4484, Jan. 2011, vol. 22, no. 2, pp. 1-10.
4. ZEMAN, Miro, KRČ, Janez. Optical and electrical modeling of thin-film silicon solar cells. Journal of materials research, ISSN 0884-2914, Apr. 2008, vol. 23, no. 4, pp. 889-898.
5. KRČ, Janez, MALMSTRÖM, Jonas, SMOLE, Franc, TOPIČ, Marko. Determination of light scattering properties of Cu(In,Ga)Se2 films for solar cells. V: 20th European Photovoltaic Solar Energy Conference, 6-10 June 2005, Barcelona, Spain. Proceedings of the international conference. München: WIP - Renewable Energies, cop. 2005, pp. 1831-1834.
6. TOPIČ, Marko, ČAMPA, Andrej, FILIPIČ, Miha, BERGINC, Marko, OPARA KRAŠOVEC, Urša, SMOLE, Franc. Optical and electrical modelling and characterization of dye-sensitized solar cells. V: 19th International Photovoltaic Science and Engineering Conference and Exhibition (PVSEC-19), Korea, 9-13 November 2009, (Current applied physics, ISSN 1567-1739, Vol. 10, iss. 3, suppl. 1). New York: Elsevier, 2010, pp. 425-430.

 

Users

Kaneka Corp. Japan, Bosch GmbH Germany, Schott GmbH Germany, LG Display Co. Ltd. Korea, EPFL IMT Neuchatel Switzerland, Helmholz Zentrum Berlin Germany, SCN Uni. China and others.