We have several measurement instruments for I-V characterization of the optoelectronic devices covering different voltage and current ranges. The measurements could be performed under illumination or in the dark.
Keithley 238 is a source meter unit (SMU) can measure extremely low current (10 fA) therefore it is mostly used for I-V characterization of the sensors and smaller solar cells. Its maximal voltage and currents are 100 V and 1 A, respectively.
Keithley 2602 is a source meter unit (SMU) with higher current output i.e. up to 3 A while the maximal voltage equals 40 V therefore it is mostly used to characterize solar cells having higher areas. The instrument has two separated SMU channels. Our solar cells characterization system consists of two Keithley 2602.
HP4145B is another instrument used for I-V characterization of the semiconductor devices and has 4 SMU channels. It allows characterization of the devices having up to 4 terminals where the voltage up to 100 V and currents up to 100 mA could be measured.
Two instruments could be used for dynamic characterization of the semiconductor devices.
HP4280A measures a CV characteristic of the semiconductor structures mostly MOS capacitors. High frequency (1 MHz) CV characteristics could be measured in a voltage range up to 100V.
HP4284A is instrument for LCR measurements of the passive and active devices with inductance or capacitance.
The measurement set-up for noise characterization of the optoelectronic devices has been developed which allows noise characterization in a spectral range from mHz to 100 kHz. This allows especially the characterization of the 1/f noise. The measurement setup consists of:
- low-noise voltage preamplifier SR560 to measure the voltage noise. Its gain is between 1 and 50 000,
- low-noise current preamplifier SR570 to measure the current noise. Its trans-conductance ranges between 1 pA/V and 1 mA/V,
- low-noise current amplifier HMS564 to measure the current noise. Its trans-conductance ranges between 100 pA/V and 1 mA/V,
- two channels FFT spectral analyser SR780 with signal source.
Contacts and inquiry
For additional information please contact:
- Marko Jankovec, e-mail: firstname.lastname@example.org, phone: +386 1 4768 931
- Kristijan Brecl, e-mail: email@example.com, phone: +386 1 4768 848
- Marko Berginc, e-mail: firstname.lastname@example.org, phone: +386 1 4768 276
Or use the following mail form: