List of research equipment (co)funded by the ARIS
Research Equipment (co)funded by the Slovenian Research and Innovation Agency:
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Slot-die and blade coater
The tool handles solution processing using slot-die and blade-coating. It is positioned in a glovebox. During the deposition the substrates can be heated up to 120 °C and the films treated with a nitrogen blade.
Specifications
- Deposition size: 20 cm x 20 cm (blade coating) and 15 cm x 20 cm (slot-die coating)
- Max. temperature: 120 °C
- Controlled speed of deposition and solution flow
Contact person
Marko Jošt, e-mail: marko.jost@fe.uni-lj.si, phone: 01 4768 846
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Climate chamber
Climate humidity chamber HCP50 from Memmert is used for controlled long-term accelerated life and 85 °C/85% tests.
Specifications
- Temperature range: +18 - +90 °C
- Rel. humidity range: 20 – 95%
- Volume: 56 l
Contact person
Marko Jošt, e-mail: marko.jost@fe.uni-lj.si, phone: 01 4768 846
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Photonic Integrated Circuit Characterisation System
Description
The system is designed for the optical and electrical characterisation of photonic integrated building blocks and various photonic integrated circuits.
Optical contacting is performed via an array of single-mode optical fibres. Electrical contacting is performed via an array of contact needles. Optical contacting is automatic.
Specifications
- Automatic chip contacting measurement unit (with automatic on-chip optical coupler search method) by Maple Leaf Photonics, type MLP SD100 Probe station (6 DOF, 4 motorised axes, 2 nm tuning resolution, X/Y/Z: 50/25/12 mm chip travel, temperature stabilised adjustable chip table, 4 DOF, 1 motorised axis).
- Optical fibre array, 8 single mode fibres, 127 um spacing, angle of incidence 8 degrees
- manually adjustable electrical contacting stage (5 DOF), 10 Tu needles (DC - MHz), 150 um pitch, 8-channel current-voltage measurement card (12 V/24 mA), 16 bit output, 18 bit input
- Laser source (Santec TSL 570-P, 1480 - 1640 nm)
- optical power meter (Santec MPM-211-04-F, 4 channels, 1250 - 1680 nm, - 70 - + 5 dBm)
- optical spectrum analyser (Yokogawa AQ6370D, 600 nm - 1700 nm, maximum resolution 0.02 nm, dynamic range 70 dB)
- polarisation analyser (Keysight N7781C, 1240 nm to 1650 nm)
- Photonica software to coordinate the system and instruments and to enable rapid measurements to be made
- other associated equipment
Contact Person
Janez Krč, e-mail: janez.krc@fe.uni-lj.si, phone: 01 4768 843
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Laser system for the fabrication of thin-film minimodules
The laser system is intended for the microstructuring of thin layers and is primarily used for the fabrication of thin-film (perovskite) minimodules with the help of P1, P2 and P3 patterning lines. The laser is placed in a nitrogen glovebox and is suitable for processing both absorber (perovskite) and conductive (TCO) layers. The system includes the removal of ablated particles via a HEPA filter.
Specifications
- Two laser wavelengths of 532 and 1064 nm
- Laser beam width 25 µm
- 1 ns laser pulse
- Sample processing up to a size of 14 cm x 14 cm
- Automatic alignment of patterned lines
Contact person
Marko Jošt, e-mail: marko.jost@fe.uni-lj.si, phone: 01 4768 846
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Photoluminescence and Electroluminescence Measurement System LuQY Pro
The system is capable of measuring the photo- and electroluminescence of smaller thin-film samples. Contacting is designed for six cells on the substrate.
Specifications
- Laser excitation with a wavelength of 532 nm
- Spectral sensitivity in the wavelength range between 550-1050 nm
- Integration time from 1 ms to 65 s
- The possibility of setting the laser intensity in the range between 0.1 and 1000 mW cm-2
- Possibility to choose the laser beam size 0.1 or 1 cm2
- Possibility of measuring electroluminescence in the range of ±10 V, ±150 mA
- Automatic calculation of quantum yield and bandgap
Contact person
Marko Jošt, e-mail: marko.jost@fe.uni-lj.si, phone: 01 4768 846
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Thin film deposition equipment
Description
Thin film deposition equipment
Access
The device for depositing thin layers is located in the Laboratory for Photovoltaics and Optoelectronics. For the possibility of using the development environment, contact the head of LPVO prof. dr. Marko Topič. Due to the intensive use of the development environment for own R&D needs, use is only possible in the late afternoon.
Price list
Price for use upon agreement.
Contact person
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Thin film PV technology set-up
Description
Inertial chamber (N2) for deposition steps without presence of humidity or oxygen) and ink-jet printer for depostion of inorganic or organic inks to layers.
Access
Thin film PV technology set-up is located in Laboratory of Photovoltaics and Optoelectronics. To use the set-up the head of LPVO prof. dr. Marko Topic should be contacted.
Price list
Price for use upon agreement.
Contact person
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PVS component evaluation set-up
Description
Isolation resistivity test of PV modules, climate chamber testing of PV modules, conversion efficiency measurement of inverters.
Access
PVS component evaluation set-up is located in Laboratory of Photovoltaics and Optoelectronics. To evaluate components the head of LPVO prof. dr. Marko Topic should be contacted.
Price list
Price for use upon agreement.
Contact person
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Solar Simulator AM1.5
Description
Measurement of conversion efficiency under solar irradiance AM1.5.
Access
Measurement set-up is located in Laboratory of Photovoltaics and Optoelectronics. To characterize samples the head of LPVO prof. dr. Marko Topic should be contacted.
Price list
Price for use upon agreement.
Contact person
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UV/Vis/NIR Spectrophotometer
Description
Measurement of direct and total transmission and reflection in the wavelength range from 200 to 3300 nm.
Access
Measurement set-up is located in Laboratory of Photovoltaics and Optoelectronics. To characterize samples the head of LPVO prof. dr. Marko Topic should be contacted.
Price list
Price for use upon agreement.
Contact person
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